今日报告
中科院物理所
2015-05-11 08:30:34
时间：2015年05月11日 星期一 14:30
地点：中科院物理研究所 M楼234报告厅
报告人：Prof. Ichiro Takeuchi
Department of Materials Science and Engineering
University of Maryland
报告人简介：Ichiro Takeuchi is Professor of Materials Science and Engineering and Affiliate Professor of Physics at the University of Maryland. He got his B.S. from Caltech and his PhD from the University of Maryland, both in Physics. He was a postdoctoral research fellow at Lawrence Berkeley National Lab from 1996 to 1999. He was also previously a member of the technical staff at NEC Corporation’s fundamental research lab in Japan. Takeuchi has held visiting professor positions at the University of Tokyo, Tokyo University of Science, Tokyo Institute of Technology, and Ruhr University Bochum in Germany. Takeuchi holds a number of patents on the combinatorial methodology, as well as materials discovered by the combinatorial method. Takeuchi is a fellow of the American Physical Society.
报告摘要：Throughout the history of mankind, scientists and engineers have relied on the slow and serendipitous trial-and-error approach for materials discovery. In 1990s, the combinatorial approach was pioneered in the pharmaceutical industry in order to dramatically increase the rate at which new chemicals are identified. The high-throughput concept is now widely implemented in a variety of fields in materials science. We have developed combinatorial thin film synthesis and characterization techniques in order to perform rapid survey of previously unexplored materials phase space in search of new inorganic functional materials. Various thin film deposition schemes including pulsed laser deposition, electron-beam deposition, and co-sputtering are implemented for fabricating massive arrays of compositionally varying samples on individual combinatorial libraries. A suite of high-throughput characterization tools are employed to screen the combinatorial libraries and map different physical properties of materials as a function of sweeping composition changes. They include room-temperature scanning SQUID microscopy, microwave microscopy, and micromachined MEMS cantilever arrays. Advanced characterization techniques at synchrotron beam lines are used for rapid diffraction as well as x-ray magnetic circular dichroism measurements. I will discuss our recent work on data driven strategies to discovery and integration of the combinatorial experimental approach with theory.